标题:
Method for quantifying skin changes caused by six external evils and method for screening skin condition-improving materials using the same
当前申请(专利权)人:
AMOREPACIFIC CORPORATION
发明人:
LEE, JIN YOUNG | KWON, SUN SANG | YEOM, MYEONG HOON | KIM, DUCK HEE | KIM, HAN KON
简单同族:
CN102203279A | JP2012511694A | JP2014224825A | JP5984882B2 | KR101645937B1 | KR1020100052938A | US20110217716A1 | US20140377756A1 | WO2010056012A2 | WO2010056012A3