标题:
Particle analysis as a detection system for particle-enhanced assays
当前申请(专利权)人:
BECKMAN COULTER, INC.
发明人:
TSAI, TENLIN, S. | XU, RENLIANG
简单同族:
AU2002320493A1 | EP1425568A2 | EP1425568A4 | JP2004536302A | US20030013083A1 | WO2003008929A2 | WO2003008929A3