标题:
Ultrasound examination system and ultrasound examination method
当前申请(专利权)人:
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
发明人:
SAKANASHI, HIDENORI | NOSATO, HIROKAZU | IWATA, MASAYA | TAKAHASHI, EIICHI | YAMAZAKI, YUUDAI
简单同族:
CN106999161A | CN106999161B | EP3225170A1 | EP3225170A4 | EP3225170B1 | JP6281994B2 | JPWO2016088758A1 | KR102014104B1 | KR1020170082630A | US20170258451A1 | WO2016088758A1