标题:
Apparatus and method for analyzing component of object, and image sensor
当前申请(专利权)人:
SAMSUNG ELECTRONICS CO., LTD.
发明人:
JANG, HYEONG SEOK | MOON, HYUN SEOK | SHIM, JAE WOOK | EOM, KUN SUN | JUNG, MYOUNG HOON
简单同族:
CN110793924A | EP3605065A1 | KR1020200014524A | US20200041342A1