标题:
Method and apparatus for detection of interference in impedance based measurements
当前申请(专利权)人:
GENERAL ELECTRIC COMPANY
发明人:
TAKALA, PANU ANTERO | UUTELA, KIMMO HENRIK | BROCKL, MIKAEL | HUIKU, MATTI
简单同族:
GB201604429D0 | GB2548372A | US20190076048A1 | WO2017160949A1