标题:
Method for analyzing stress based on multi-measured bio-signals
当前申请(专利权)人:
SAMSUNG ELECTRONICS CO., LTD. | KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (KAIST)
发明人:
CHO, CHUL-HO | KIM, DE-SOK | CHO, JAE-GEOL | JUNG, SUN-TAE | LIZAWATI, SALAHUDDIN
简单同族:
KR101435680B1 | KR1020090027024A | US10130292 | US20090069641A1 | US20140200468A1 | US8696566