标题:
Method for measuring biometric information and electronic device performing the same
当前申请(专利权)人:
SAMSUNG ELECTRONICS CO., LTD.
发明人:
KIM, JIN | JUNG, HYUNG ROCK | SEO, HYE JUNG | CHEONG, CHEOL HO | CHUN, JAE WOONG | CHOI, WON SUK | HEO, CHANG RYONG
简单同族:
CN106256314A | EP3106085A1 | KR1020160149911A | US20160367138A1 | US9962082