标题:
System and method for estimating electrical conduction delays from immittance values measured using an implantable medical device
当前申请(专利权)人:
PACESETTER, INC.
发明人:
WENZEL, BRIAN JEFFREY | PANESCU, DORIN | NAWARE, MIHIR | SIOU, JEFFERY
简单同族:
US20090299211A1 | US20130137999A1 | US8208999 | US9113789