标题:
Methods and apparatus for measuring the internal structure of an object
当前申请(专利权)人:
MICRIMA LIMITED
发明人:
CRADDOCK, IAN | PREECE, ALAN WILLIAM | NILAVALAN, RAJAGOPAL DEPT. OF ELECTRONICS&COMP. | LEENDERTZ, JACK ALBERT | BENJAMIN, RALPH | WILSON, FREDERICK JOHN 9 SPRATS BARN CRESCENT
简单同族:
EP1850743A2 | EP1850743B1 | GB0502651D0 | JP2008530546A | JP2008530546A5 | JP2013029527A | JP5312802B2 | JP5646574B2 | US20080071169A1 | WO2006085052A2 | WO2006085052A3