标题:
Method and apparatus for time-based analysis of electrical impedance tomography data
当前申请(专利权)人:
CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHN
发明人:
BRUNNER, JOSEF, X. | SOLA I CAROS, JOSEP
简单同族:
EP2593004A1 | EP2593004B1 | US20130218031A1 | US9375186 | WO2012007425A1