标题:
Pixel and array test method for the same
当前申请(专利权)人:
SAMSUNG DISPLAY CO., LTD.
发明人:
JIN, GUANG HAI | CHOI, JAE-BEOM | JUNG, KWAN-WOOK | LEE, JUNE-WOO | KIM, MOO-JIN | KIM, JEE-HOON
简单同族:
KR101991099B1 | KR1020130110419A | US20130257437A1 | US9018947